Dynamical XPS measurements for probing photoinduced voltage changes

Impedance-type measurements using XPS

An impedance type of measurement using X-ray photoelectron spectroscopy is applied for probing charging/discharging dynamics of a sample containing Rb deposited on a SiO2/Si substrate containing an octadecyltrichlorosilane (OTS) bilayer coating. The OTS bilayer coatings have possible use as antirelaxationwall coatings for alkali atom vapor cells inminiaturized instruments such as chip-scale ato...

Neuro-Fuzzy Based Algorithm for Online Dynamic Voltage Stability Status Prediction Using Wide-Area Phasor Measurements

In this paper, a novel neuro-fuzzy based method combined with a feature selection technique is proposed for online dynamic voltage stability status prediction of power system. This technique uses synchronized phasors measured by phasor measurement units (PMUs) in a wide-area measurement system. In order to minimize the number of neuro-fuzzy inputs, training time and complication of neuro-fuzzy ...

High-voltage Measurements

Photoinduced Changes in High Temperature Superconducting Films

Photoexcitation experiments performed in oxygen deficient but metallic YBa,Cu,O, c-axis oriented films revealed that the persistent photoinduced enhancement of conductivity and superconductivity are not restricted to the insulating side of the metal-insulator transition. A clear increase of the critical temperature T,, which is accompanied by a decrease of the resistivity in the normal state pa...

Influence of Surface Roughness on Results of XPS Measurements

A concise overview of methods estimating the effect of surface roughness on results of XPS measurements is given. Tilt-angle histogram method (THM), straight-line approximation (SLA) and Monte Carlo (MC) simulations are considered. An application of such methods is described in detail in the case of flat and artificially corrugated silicon surfaces.